Synthesis and surface properties of polyamide-CuxSe composite thin films.

A study of copper selenide (CuxSe) thin film deposition on PA 6 polymer surface via adsorption/diffusion method and the resulting surface properties is presented. A two-stage process used to deposit these thin films involves (a) selenization in 0.1 M K2SeS2O6 at pH 2.15 and 60°C followed by (b) treatment with 0.34 M Cu(II) and 0.06 M Cu(I) salt soln. at 80°C. Resulting chem. and phys. properties of CuxSe films were investigated using XRD, XPS, SEM, and sheet resistivity measurements. XRD data showed a complex mixt. of CuxSe phases with peaks due to the elemental Se present at longer exposures. Thin film bulk elemental compn. varied with the exposure time whereas XPS anal. showed the surface to be slightly copper enriched. Addnl., mostly Cu-Se bonds were obsd. on the surface with minor oxidn. products. SEM cross-sectional anal. showed distinct CuxSe film formation on PA 6 surface with thickness of ∼1-5 μm. A sheet resistance of 150 ± 10 Ω/☐ was achieved after 120 min of selenization for all samples and remained const. after longer exposures. [on SciFinder(R)]